META Conference, META'10

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Characterization of single nanoparticles with highly focused polarization tailored light beams
Thomas Bauer, Peter Banzer, Ulf Peschel, Gerd Leuchs

Last modified: 2009-10-31

Abstract


We present an optical approach to characterize single sub-wavelength nanoparticles by means of polarization tailored field distributions generated by highly focused radially and azimuthally polarized doughnut beams. These field structures enable the distinction between  different particle shapes as well as their orientation.